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Akademische und professionelle Bücher  Reference  Data Analysis & Modelling  Microscopy & Spectroscopy

Introduction to Scanning Transmission Electron Microscopy

Handbook / Manual
Series: Microscopy Handbooks Volume: 39
By: RJ Keyse, AJ Garratt-Reed, PJ Goodhew and GW Lorimer
114 pages, B/w photos, illus, figs, tabs, SEMs
Introduction to Scanning Transmission Electron Microscopy
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  • Introduction to Scanning Transmission Electron Microscopy ISBN: 9781859960660 Paperback Jun 1997 Not in stock: Usually dispatched within 1 week
    £79.99
    #82272
Price: £79.99
About this book Contents Customer reviews Related titles

About this book

Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanalysis on thin sections of material. The technique is used in many modern transmission electron microscopes and an increasing number of special

Contents

Why STEM? - STEM versus TEM; STEM Optics; The specimen; Imaging in the STEM; Diffraction in the STEM; Microanalysis in the STEM; Mapping in the STEM; Limits to STEM and advanced STEM; Glossary; Further reading; Index

Customer Reviews

Handbook / Manual
Series: Microscopy Handbooks Volume: 39
By: RJ Keyse, AJ Garratt-Reed, PJ Goodhew and GW Lorimer
114 pages, B/w photos, illus, figs, tabs, SEMs
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